Advantest B6700S Memory Burn-in Tester

B6700S

Advantest's new zero-footprint B6700S system offers a dramatically lower-cost test solution for NAND flash memories and can be embedded within a multi-wafer probing system used in individual wafer-level testing, avoiding any costs associated with occupying floor space in lab or production environments.

Format

PNG

Source

Advantest America, Inc.

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