FEI’s New Themis Z S
FEI’s New Themis Z S/TEM Sets New Standards for High Performance Imaging and Analysis
July 14, 2016 08:15 ET | FEI Company
HILLSBORO, Ore., July 14, 2016 (GLOBE NEWSWIRE) -- FEI (NASDAQ:FEIC) today released its new Themis™ Z scanning/transmission electron microscope (S/TEM), once again raising the bar for imaging and...
FEI Launches Apreo –
FEI Launches Apreo – Industry-Leading Versatile, High-Performance SEM
May 03, 2016 08:15 ET | FEI Company
HILLSBORO, Ore., May 03, 2016 (GLOBE NEWSWIRE) -- FEI (NASDAQ:FEIC) today announced the new Apreo™ scanning electron microscope (SEM), offering an industry-leading range of applications. In fields...
FEI and CEOS deliver
FEI and CEOS deliver First Sub-Angstrom, Low-Voltage Electron (SALVE) Microscope to the University of Ulm
April 25, 2016 06:00 ET | FEI Company
HILLSBORO, Ore. and HEIDELBERG, Germany, April 25, 2016 (GLOBE NEWSWIRE) -- FEI (NASDAQ:FEIC) and CEOS announced today that they have delivered the first sub-Ångstrom, low-voltage electron (SALVE)...
FEI Titan at nanoGUNE
Photo Release -- FEI Installs Advanced Electron Microscopes at nanoGUNE Nanoscience Research Center
May 11, 2011 08:20 ET | FEI Company
HILLSBORO, Ore. and SAN SEBASTIAN, Spain, May 11, 2011 (GLOBE NEWSWIRE) -- FEI Company (Nasdaq:FEIC), a leading scientific instrumentation company, and the Basque Nanoscience Cooperative Research...