SOUTH PLAINFIELD, N.J., Sept. 7, 2005 (PRIMEZONE) -- CAPE Systems Group, Inc. (OTCBB:CYSG), a leading provider of software technology for packaging design, pallet optimization, RFID Asset Tracking, inventory and warehouse management, supply chain execution and order fulfillment, today announced that it will be showcasing its state-of-the-art RFID products at the 2005 EPC Global U.S. Conference at the Georgia World Congress Center in Atlanta from September 13th -- 15th. Among the products on display will be CAPE's RFID Apply and Comply(tm) compliance RFID labeling solution and its unique RFID Tag Locator(tm) product, which determines the optimum placement of an RFID tag for the best reading results. CAPE will be at Booth 411.
Brad Leonard, Vice President, Worldwide Sales of CAPE, commented, "This is a premier show for the RFID industry and we will be pleased to exhibit our state-of-the art RFID product set at this prestigious event."
About CAPE Systems
CAPE Systems is an international provider of supply chain management technologies. CAPE Systems offers a comprehensive range of software systems and tools, from packaging and pallet optimization software, RFID asset tracking, to integrated warehouse and inventory management solutions, pick-to-light systems, and transportation management systems for enterprise wide and collaborative supply chain optimization. For more information about CAPE visit: www.capesystems.com.
Safe Harbor
Statements about the company's future expectations, including future revenue and earnings and all other statements in this press release, other than historical facts, are "forward-looking" statements and are made pursuant to safe harbor provisions of the Securities Litigation Reform Act of 1995. Such forward-looking statements involve risks and uncertainties and are subject to change at any time. The company's actual results could differ materially from expected results. In reflecting subsequent events or circumstances, the company undertakes no obligation to update forward-looking statements.