PDF Solutions Introduces a New Offering for Memory IC Manufacturers

Memory Yield Enhancement Integrated Offering Successfully Implemented At Elpida Memory's Hiroshima Fab


SAN JOSE, Calif., May 14, 2007 (PRIME NEWSWIRE) -- PDF Solutions, Inc. (Nasdaq:PDFS), the leading provider of process-design integration technologies to enhance IC manufacturability, announced the release of its new offering aimed at the IC Memory market. The Memory Yield Enhancement solution is based on PDF Solutions' tools, methods, and services that have been proven to accelerate yield ramps and optimize mature yields in over 30 advanced CMOS process ramps to date. The new offering addresses the special challenges and constraints that Memory IC manufacturers face as they strive to reduce the duration of new node ramps and achieve higher mature yields during mass production.

PDF Solutions also announced that it has successfully deployed the Memory Yield Enhancement solution at Elpida Memory Inc., a leading Japanese DRAM manufacturer. The continuing engagement, which began in 2006, covers two advanced DRAM process nodes at Elpida's fab in Hiroshima, Japan and includes optimizing yield learning during both ramp and mass production. The Memory Yield Enhancement engagement encompasses deployment of PDF Solutions' Characterization Vehicle(r) (CV(r)) Infrastructure combined with enhanced product engineering tools and methods tailored for Memory IC products, to more rapidly reduce yield loss due to random and systematic defectivity and process-design interactions. PDF Solutions' tools and methods helped Elpida ramp DRAM yields faster than historical learning rates resulting in higher and more stable yields during subsequent mass production.

PDF Solutions' Scribe CV(r) methodology was particularly beneficial for Elpida's production environment since it leverages test structures embedded in the scribe area on existing product wafers. The large volume of data extracted from these product wafers provided insight into key yield loss mechanisms that would otherwise be very difficult to identify. PDF Solutions expects that Elpida will continue to rely on Scribe CV(r) data for equipment production control and prioritizing related engineering resources.

"Memory manufacturers face business challenges similar to those faced by logic manufacturers," said Sherry Lee, senior product marketing director (MPS) at PDF Solutions. "By adapting PDF Solutions' offering to the DRAM and Flash markets, we are leveraging our experience in logic manufacturing processes to help leading memory manufacturers achieve more predictable, consistent, and cost-effective process ramps, resulting in higher yields and improved profitability for our clients," added Lee.

PDF Solutions Integrated Yield Ramp and Mass Manufacturing Offering for DRAM and Flash Markets

The Memory Yield Enhancement engagement encompasses deployment of PDF Solutions' Characterization Vehicle(r) (CV(r)) Infrastructure combined with enhanced product engineering tools and methods tailored for Memory IC products, to more rapidly reduce yield loss due to random and systematic defectivity and process-design interactions. The result is a significant increase in the speed at which yield learning can occur during the process ramp, as well as enabling higher and more stable yields during subsequent mass production. PDF Solutions' Integrated Yield Ramp (IYR) and Mass Production engagements also include a cross-functional team of engineers that works on-site collaboratively with the client to improve client profitability through accelerated yield learning and improved product performance at every stage of IC manufacturing: from early ramp through mass production. PDF Solutions' offering for the memory market includes the Back-End-Of-Line short-flow CV(r) test chip as well as the patented Scribe CV(r), an array of highly-dense test structures that are placed directly in the scribe on product wafers to provide detailed information on variability in the manufacturing line.

PDF Solutions offers two additional products for the IC memory market: dataPOWER(r), PDF Solutions' market-leading Yield Management System (YMS) software, and Maestria(r), PDF Solutions' market-leading Fault Detection and Classification (FDC) software. When used in conjunction with PDF Solutions' CV(r) test structures and chips these tools are designed to provide a comprehensive and powerful, integrated mass production solution for memory IC manufacturers.

About PDF Solutions

PDF Solutions, Inc. (Nasdaq:PDFS) is the leading provider of process-design integration technologies and services for manufacturing integrated circuits (ICs). PDF Solutions enables semiconductor companies to create IC designs that can be more easily manufactured using manufacturing processes that are more capable. By simulating deep sub-micron product and process interactions, the PDF solution offers clients reduced time to market, increased IC yield and performance, and enhanced product reliability and profitability. PDF Solutions also offers the industry leading Yield Management System (YMS) software, dataPOWER(r), and Fault Detection and Classification (FDC) software, Maestria(r), to enhance yield improvement and production control activities at leading fabs around the world. Headquartered in San Jose, Calif., PDF Solutions operates worldwide with additional offices in China, Europe, and Japan. For the company's latest news and information, visit http://www.pdf.com/.

The PDF Solutions, Inc. logo is available at http://www.primenewswire.com/newsroom/prs/?pkgid=3199

Characterization Vehicle, CV, dataPOWER, Maestria, pdFasTest, PDF Solutions, and the PDF Solutions logo are registered trademarks of PDF Solutions, Inc.



            

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