MILPITAS, Calif., Jan. 6, 2009 (GLOBE NEWSWIRE) -- LTX-Credence Corporation (Nasdaq:LTXC), a global provider of focused, cost-optimized ATE solutions, today announced the addition of two new FX digital options for its X-Series test platform -- the FX2 and FX-HS digital subsystems. Both options were designed to enhance the ability of the X-Series platform to provide cost-optimized test solutions for the full range of consumer and mobility devices.
The FX2 offers double the digital pin count per instrument as current FX1 digital subsystems, resulting in lower cost per pin and twice the pin count per system. This enables higher levels of multisite for cost-effective testing across a broad range of applications. The FX-HS provides a powerful combination of hardware and software features targeted at the test requirements of high speed IOs, including DDR parallel and MIPI SerDes, that are being designed into next generation consumer and mobility devices. The real time protocol detect feature built into the FX-HS simplifies test development and can be used to reduce test time of high speed IOs by up to 30%.
"Our customers face increasing pressure to enhance the functionality of their devices while at the same time reducing device cost," noted Dave Tacelli, LTX-Credence CEO and president. "LTX-Credence is committed to helping our customers address this challenge with test platforms that are focused and cost-optimized to match the individual requirements of their devices. Our two new digital options for the X-Series test platform demonstrate how we do just that -- reducing cost of test while at the same time providing the right performance for our customers' next generation device portfolios."
"As we develop new instrumentation for our test platforms, LTX-Credence works closely with our key customers to define both performance and cost of test requirements," added Bruce MacDonald, vice president of marketing for LTX-Credence. "Our new FX digital options represent this approach as we are now able to offer new levels of digital test capability for consumer and mobility applications, without the need for an expensive liquid-cooled tester infrastructure. Our ability to provide high performance in an air-cooled test system is vital to reducing our customers' operational and test costs."
Both instruments are available for immediate delivery for all X-Series LX, CX, MX and EX configurations.
About the FX2
The FX2 digital subsystem offers double the pin count per slot of the standard FX1 digital subsystem, while providing the same performance levels and FX1 compatibility. This makes the FX2 ideally suited for multisite testing. It offers improved scan chaining for multisite testing, high voltage pin electronic capability for embedded FLASH testing, full-featured synchronization, and independent timing domains to support multiple periods running simultaneously. Additional capabilities include differential drive and compare, memory test per pin, 200 MHz IO data rates, scan chains with up to 3 G memory depth, keep alive, 64 M vector memory, and a real time capture features using the 16 M data capture memory.
About the FX-HS
The FX-HS provides high speed digital pattern rates up to 800 Mbps. In addition to providing many of the standard FX digital option features, it enables RF-Dig protocol detect and capture using symbol matching, new high frequency modes in the pattern sequencers, and enhanced DSP send and receive capability. Pin functions include 800 Mbps data rates, differential operation, scan chains with up to 3 G memory depth, keep alive functions all programmable on the fly, 64 M vector memory, and 16 M capture memory.
About the X-Series Test Platform
The X-Series test platform offers a variety of configurations designed to provide lowest cost testing for the broad range of devices used in mobile, power, automotive, industrial and instrumentation markets. The X-Series meets the test challenges of the advanced mixed signal device technologies used in these markets through its comprehensive portfolio of DC, power, DSP, RF and digital instrumentation.
About LTX-Credence Corporation
Formed by the 2008 merger of LTX Corporation and Credence Systems Corporation, LTX-Credence is a global provider of focused, cost-optimized ATE solutions designed to enable customers to implement best-in-class test strategies to maximize their profitability. LTX-Credence addresses the broad, divergent test requirements of the wireless, computing, automotive and entertainment market segments, offering a comprehensive portfolio of technologies, the largest installed base in the Asia-Pacific region, and a global network of strategically deployed applications and support resources. Additional information can be found at www.LTX-Credence.com.
LTX-Credence is a trademark of LTX-Credence Corporation. All other trademarks are the property of their respective owners.