MILPITAS, Calif., Nov. 20, 2013 (GLOBE NEWSWIRE) -- Nanometrics Incorporated (Nasdaq:NANO), a leading provider of advanced process control metrology and inspection systems, today announced the company's participation in the following investor events:
2013 Credit Suisse Annual Technology Conference
The Phoenician, Scottsdale, AZ
December 4, 20132nd Annual Midtown CAP Summit
Marriott Marquis, New York, NY
December 11, 2013
The presentation material utilized during both events will be made accessible on the investor page of Nanometrics' website at www.nanometrics.com.
About the Midtown CAP Summit
The Midtown CAP Summit is hosted by executive management from the following participating companies: Aehr Test Systems (AEHR), Axcelis (ACLS), Brooks Automation (BRKS), Camtek (CAMT), Cascade Micro (CSCD), Cohu (COHU), Electro Scientific (ESIO), Entegris (ENTG), FormFactor (FORM), inTEST (INTT), Intevac (IVAC), LTX-Credence (LTXC), Mattson Technology (MTSN), Nanometrics (NANO), Nova Measuring (NVMI), Rudolph Technologies (RTEC), Tessera (TSRA), Ultra Clean Technology (UCTT), Ultratech (UTEK) and Veeco Instruments (VECO), and will feature a "round-robin" format consisting of a series of small group meetings.
The Midtown CAP Summit is by invitation only and is open to accredited investors and publishing research analysts. As space is limited, please RSVP early. Hosts reserve the right to limit attendance as necessary. Last day for registration is November 30. To RSVP for the Midtown CAP Summit, please contact the event's co-chairs:
Laura J. Guerrant-Oiye
Guerrant Associates
Phone: (808) 882-1467
Email: lguerrant@guerrantir.com
Claire E. McAdams
Headgate Partners LLC
Phone: (530) 265-9899
Email: claire@headgatepartners.com
About Nanometrics
Nanometrics is a leading provider of advanced, high-performance process control metrology and inspection systems used primarily in the fabrication of semiconductors and other solid-state devices, such as data storage components and discretes including high-brightness LEDs and power management components. Nanometrics' automated and integrated metrology systems measure critical dimensions, device structures, overlay registration, topography and various thin film properties, including film thickness as well as optical, electrical and material properties. The company's process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced wafer-scale packaging applications. Nanometrics' systems enable advanced process control for device manufacturers, providing improved device yield at reduced manufacturing cycle time, supporting the accelerated product life cycles in the semiconductor market. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Select Market under the symbol NANO. Nanometrics' website is http://www.nanometrics.com.