Applied Materials' SEMVision™ H20 system combines the industry’s most sensitive eBeam technology with advanced AI image recognition to enable better and faster analysis of buried nanoscale defects in the world’s most advanced chips.
Applied Materials' SEMVision™ H20 system combines the industry’s most sensitive eBeam technology with advanced AI image recognition to enable better and faster analysis of buried nanoscale defects in the world’s most advanced chips.