Applied Materials’ CFE Technology: the Next-Generation of eBeam Imaging
Operating at room temperature, Applied Materials’ cold field emission (CFE) technology [shown on the right] produces a narrower beam with more electrons, thereby increasing nanoscale image resolution by up to 50% and imaging speed by up to 10X compared to conventional thermal field emission (TFE) eBeam technology [shown on the left].
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JPEG
Source
Applied Materials, Inc.