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HILLSBORO, Ore., June 13, 2011 (GLOBE NEWSWIRE) -- FEI (Nasdaq:FEIC), a leading instrumentation company providing microscopy systems for research and industry, today released the Vion™ plasma...
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NEWTON, MA--(Marketwire - Jun 10, 2011) - Over 4,000 engineers, scientists and industry professionals from around the world gathered at the Donald E. Stephens Convention Center in Rosemont, IL June...
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LIVERMORE, CA--(Marketwire - Jun 8, 2011) - FormFactor, Inc. (NASDAQ: FORM) today introduced the next generation of its SmartMatrix family of 300-mm full wafer contact probe cards for DRAM devices --...
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ROSEMONT, IL--(Marketwire - Jun 7, 2011) - Sensors Magazine today announced the 12 companies that received the magazine's 2011 "Best of Sensors Expo" Awards for outstanding achievement, which were...
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HAMPTON, Va., June 7, 2011 (GLOBE NEWSWIRE) -- Measurement Specialties, Inc. (Nasdaq:MEAS) (the "Company"), a global designer and manufacturer of sensors and sensor-based systems, announces results...
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HAMPTON, Va., June 3, 2011 (GLOBE NEWSWIRE) -- Measurement Specialties, Inc. (Nasdaq:MEAS), a global designer and manufacturer of sensors and sensor-based systems, will report earnings for the fiscal...
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SCHAUMBURG, IL--(Marketwire - Jun 1, 2011) - Omron's Micro Device Division (MDD) has a number of new MEMS products in development to watch for in the coming year including an Absolute Pressure Sensor...
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NEWTON, MA--(Marketwire - May 26, 2011) - More than 150 exhibitors will showcase the newest technologies for sensors and sensors-related industries at the 2011 Sensors Expo & Conference, June 7-8...
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SAN JOSE, CA--(Marketwire - May 23, 2011) - In its newest survey of the world's top suppliers of semiconductor probe cards, leading market research firm VLSI Research Inc ranked MicroProbe as the...
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BEAVERTON, OR--(Marketwire - May 19, 2011) - Cascade Microtech, Inc. (NASDAQ: CSCD), a leading expert at precision measurements at the wafer level, today announced it has elected John (J.D.)...