FREMONT, Calif., March 17, 2011 (GLOBE NEWSWIRE) -- Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received an order for their newest system, the Advanced Burn-in and Test System (ABTS). This is the first ABTS ordered by this customer. This system is configured to do burn-in and test of high pin count logic ICs. The system has 320 IO channels and is also backward compatible with Aehr Test Systems' earlier generation ATX system, preserving the customer's investment in burn-in-boards.
Carl Buck, vice president of marketing at Aehr Test, stated, "The customer for this ABTS system is a European supplier of high reliability, military/aerospace ASIC devices. It was critical to this customer that the system have backward compatibility to their existing systems and also have additional capabilities for anticipated future needs. This ABTS not only has more channels than the ATX, but also more device power."
The ABTS family of products is based on a new hardware and software architecture that is designed to address not only today's devices, but also future devices for many years to come. It is designed to test and burn-in memory as well as both high-power logic and low-power logic in addition to high pin count logic. It can be configured to provide individual device temperature control for devices up to 70W or more and it uses N+1 redundancy technology for many key components in the system to provide the highest possible system uptime.
About Aehr Test Systems
Headquartered in Fremont, California, Aehr Test Systems is a worldwide supplier of systems for burning-in and testing memory and logic integrated circuits and has an installed base of more than 2,500 systems worldwide. Aehr Test has developed and introduced several innovative products, including the ABTS, FOXTM and MAX systems and the DiePak® carrier. The ABTS system is Aehr Test's newest system for packaged part test during burn-in for both low-power and high-power logic as well as all common types of memory devices. The FOX system is a full wafer contact test and burn-in system. The MAX system can effectively burn-in and functionally test complex devices, such as digital signal processors, microprocessors, microcontrollers and systems-on-a-chip. The DiePak carrier is a reusable, temporary package that enables IC manufacturers to perform cost-effective final test and burn-in of bare die. For more information, please visit the Company's website at www.aehr.com.
Safe Harbor Statement
This release contains forward-looking statements that involve risks and uncertainties relating to projections regarding customer demand and acceptance of Aehr Test's products. Actual results may vary from projected results. These risks and uncertainties include, without limitation, acceptance by customers of the ABTS technology, acceptance by customers of the ABTS systems shipped upon receipt of a purchase order and the ability of new products to meet customer needs or perform as described. See Aehr Test's recent 10-K, 10-Q and other reports from time to time filed with the Securities and Exchange Commission (SEC) for a more detailed description of the risks facing our business. The Company disclaims any obligation to update information contained in any forward-looking statement to reflect events or circumstances occurring after the date of this press release.