Microsemi to Showcase Solutions at RADECS Conference in Sevilla, Spain

Company Will Also Present Paper on 'SET Characterization & Mitigation in 65-nm Test Structures'

Irvine, California, UNITED STATES

ADVISORY, Sept. 12, 2011 (GLOBE NEWSWIRE) --


Microsemi Corporation will be exhibiting its latest product information on field-programmable gate arrays (FPGAs) for space applications, as well as Radiation Hardened (Rad Hard) MOSFETs, transistors, POLs and regulators, at the Radiation Effects on Components and Systems (RADECS) conference in Sevilla, Spain Sept. 20-23. In addition, Sana Rezgui, senior principal engineer of Microsemi's SoC products group, will present a paper at the conference titled, "SET Characterization & Mitigation in 65-nm Test Structures."

Individuals interested in learning more about products and solutions for space and other radiation-sensitive fields will be in attendance at RADECS, including design engineers, parts engineering managers, radiation effects scientists, quality assurance personnel, project managers and representatives from government organizations across the globe.
WHEN: Tuesday, Sept. 20 through Friday, Sept. 23, 2011.
Microsemi will be located in booth #7 at RADECS, held at the School of Engineering of the University of Sevilla at the Parque Tecnológico de la Cartuja.

About Microsemi

Microsemi Corporation (Nasdaq:MSCC) offers a comprehensive portfolio of semiconductor solutions for: aerospace, defense and security; enterprise and communications; and industrial and alternative energy markets. Products include high-performance, high-reliability analog and RF devices, mixed-signal and RF integrated circuits, customizable SoCs, FPGAs, and complete subsystems. Microsemi is headquartered in Aliso Viejo, Calif., and has more than 2,700 employees globally. Learn more at www.microsemi.com.

The Microsemi Corporation logo is available at http://www.globenewswire.com/newsroom/prs/?pkgid=1233


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