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VOICE 2019 Developer Conference Opens Registration and Announces Keynote Speakers for U.S. Event
January 02, 2019 03:05 ET | Advantest America, Inc.
SAN JOSE, Calif., Jan. 02, 2019 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has opened registration for its VOICE 2019 Developer Conference...
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Advantest to Exhibit Wide Range of Semiconductor Test Solutions Enabling 5G Connectivity at SEMICON Japan on December 12-14
December 04, 2018 03:05 ET | Advantest America, Inc.
TOKYO, Dec. 04, 2018 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) will feature more than a dozen of its advanced test solutions that enable 5G...
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Advantest Introduces New Solution for System-Level Testing of Advanced, High-Speed Semiconductor Memories for Mobile Applications
November 27, 2018 03:05 ET | Advantest America, Inc.
TOKYO, Nov. 27, 2018 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has unveiled its new T5851 STM16G memory tester for evaluating high-speed...
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Advantest Introduces New Module, Extending EVA100 Measurement System’s Capabilities to Include High-Voltage Semiconductors
November 12, 2018 03:05 ET | Advantest America, Inc.
Suitable for Engineering or Manufacturing Environments, HVI Module Ensures Reliability of ICs for High-Volume Consumer MarketsTOKYO, Nov. 12, 2018 (GLOBE NEWSWIRE) -- Leading semiconductor test...
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Advantest and TSSI Announce New, Robust Pattern Conversion Software for Cloud-Based Semiconductor Testing
October 30, 2018 03:05 ET | Advantest America, Inc.
New TesterBridge Software Product is Being Demonstrated This Week at International Test Conference in Phoenix PHOENIX, Oct. 30, 2018 (GLOBE NEWSWIRE) -- Test Systems Strategies, Inc. (TSSI), the...
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Advantest Extends V93000 Platform’s Capabilities to Include Parametric Testing for Developing and Manufacturing Next-Generation ICs
October 30, 2018 03:05 ET | Advantest America, Inc.
TOKYO, Oct. 30, 2018 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has introduced its new V93000 SMU8 parametric tester to meet chip makers’...
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Advantest Introduces Two New Systems in its B6700 Series of Memory Burn-In Testers for Next-Generation NAND Flash Memories
October 24, 2018 03:05 ET | Advantest America, Inc.
New B6700L Tester Expands the Platform’s Temperature Range While B6700S System Offers Zero-Footprint Configuration TOKYO, Oct. 24, 2018 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment...
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Advantest to Participate in International Test Conference 2018 in Phoenix, Arizona, October 28 to November 2
October 22, 2018 03:05 ET | Advantest America, Inc.
Test Industry Market Leader to Exhibit Newest IC and AI Test Solutions and Participate in Technical Program SAN JOSE, Calif. , Oct. 22, 2018 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment...
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Advantest Launches Newest Memory Burn-In Tester to Meet Growing Global Demand for NAND Flash and DRAM Devices
October 10, 2018 03:05 ET | Advantest America, Inc.
TOKYO, Oct. 10, 2018 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has announced its next-generation B6700D memory burn-in tester to meet...
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Advantest Issues Call for Papers for VOICE 2019 Developer Conference with Sessions in the U.S. and Singapore
October 09, 2018 03:05 ET | Advantest America, Inc.
VOICE Events to Feature New Technology Track on T2000 Tester and Keynote Address by Dr. Hugh Herr of MIT’s Center for Extreme Bionics TOKYO, Oct. 09, 2018 (GLOBE NEWSWIRE) -- Leading semiconductor...