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September 16, 2014 14:00 ET | Source: TESCAN USA

TESCAN Introduces the New GAIA3 FIB-SEM Workstation

WARRENDALE, Pa., Sept. 16, 2014 (GLOBE NEWSWIRE) -- TESCAN, a leading provider of charged particle technology and FIB-SEM integrated analytical solutions introduced the new GAIA3 FIB-SEM workstation...