FREMONT, CA--(Marketwire - March 25, 2008) - SMART Modular Technologies (WWH), Inc. (SMART) (NASDAQ: SMOD), a leading independent manufacturer of memory modules, embedded computing subsystems, and TFT-LCD display products, today announced it has added Test During Burn-in (TDBI) to its Enterprise Class Memory (ECM) testing process. SMART's new TDBI procedure applies functional patterns, temperature, and voltage for screening or eliminating marginal DRAM devices which can cause time and stress dependent failures. Without this level of burn-in, these flaws could result in early lifetime failures for the memory device.

The industry demands high-quality DRAM memory modules. This is clearly demonstrated by OEMs' stated objectives to reduce defective parts per million (DPPM) rates to below 1000 DPPM/module in their high-end applications such as servers and routers. Dynamic burn-in combined with its proprietary ECM testing process gives SMART the ability to deliver memory modules that conform to specified failure in time (FIT) rates.

To implement its new test procedure, SMART worked with Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and burn-in equipment, to design and develop the burn-in boards and test software. SMART's new TDBI process uses Aehr Test's MTX-Fp+ system, which is a massively parallel TDBI system featuring 128 data I/O channels, enhanced pattern generation, and failure detection capability. As part of SMART's comprehensive approach to test, each cell in every DRAM is exercised during the 12-hour burn-in cycle at 125°C. Additional tests are performed after burn-in as part of SMART's comprehensive ECM testing process.

"The MTX-Fp+ system adds a versatile tool to our ECM testing process, supporting our continual drive to eliminate device failures for our customers who require extremely high reliability levels," stated Larry Alchesky, SMART's Senior Manager of Test Engineering.

Since each application stresses memory differently, SMART works closely with its customers to correlate any latent defect or single bit error (SBE) issues by customizing its testing procedures to simulate and exceed actual system conditions. By combining dynamic burn-in and ECM testing, it is SMART's ongoing goal to consistently deliver highly reliable memory modules.

"We are very pleased that SMART has chosen our MTX-Fp+ for reliability testing of their advanced DIMMs," said Bill Barraclough, Director of Product Marketing at Aehr Test. "The MTX-Fp+ system lends itself well to SMART's need for a high-quality, cost-effective method for collecting reliability data, and we expect that SMART's leadership in this area will lead other companies to validate their products' reliability using our MTX systems."

For more information regarding SMART's extensive ECM test capabilities, please visit


SMART Modular Technologies is a leading provider of memory products, offering more than 500 standard and custom products to top-tier OEMs in the computer, industrial, networking, and telecommunications sectors. Taking innovations from the design stage through manufacturing and delivery, SMART has developed a comprehensive memory product line that includes DRAM, SRAM, and Flash in various form factors. Through its subsidiary, Adtron Corporation, SMART offers high performance, high capacity solid state flash disk drives for enterprise, defense/aerospace, industrial automation, medical, and transportation markets. SMART's Display Products Group designs, manufactures and sells thin film transistors (TFT) liquid crystal display (LCD) solutions to customers developing casino gaming systems as well as embedded applications such as kiosk, ATM, point-of-service, and industrial control systems. SMART's presence in the US, Europe, Asia, and Latin America enables it to provide its customers with proven expertise in international logistics, asset management, and supply-chain management worldwide. More information on SMART can be obtained at

About Aehr Test Systems

Headquartered in Fremont, California, Aehr Test Systems is a leading worldwide provider of systems for burning-in and testing DRAMs, flash, and other memory and logic integrated circuits and has an installed base of more than 2,500 systems worldwide. Aehr Test has developed and introduced several innovative products, including the FOXTM, MTX and MAX systems and the DiePak® carrier. The FOX system is a full wafer contact test and burn-in system. The MTX system is a massively parallel test system designed to reduce the cost of memory testing by performing both test and burn-in on thousands of devices simultaneously. The MAX system can effectively burn-in and functionally test complex devices, such as digital signal processors, microprocessors, microcontrollers and systems-on-a-chip. The DiePak carrier is a reusable, temporary package that enables IC manufacturers to perform cost-effective final test and burn-in of bare die. For more information, please visit the Company's website at

Contact Information: Contact: Joy Donohue SMART Modular Technologies (978) 805-2164