Contact Information: Contact: Joy Donohue SMART Modular Technologies (978) 805-2164
SMART Modular Technologies Adds Dynamic Burn-In to Its Enterprise Class Memory Testing Process
Addressing the Industry's Need for High-Reliability Server Modules, SMART Teams With Aehr Test to Develop Its Latest Test Process
| Source: SMART Modular Technologies
FREMONT, CA--(Marketwire - March 25, 2008) - SMART Modular Technologies (WWH), Inc. (SMART)
(NASDAQ : SMOD ), a leading independent manufacturer of memory modules,
embedded computing subsystems, and TFT-LCD display products, today
announced it has added Test During Burn-in (TDBI) to its Enterprise Class
Memory (ECM) testing process. SMART's new TDBI procedure applies functional
patterns, temperature, and voltage for screening or eliminating marginal
DRAM devices which can cause time and stress dependent failures. Without
this level of burn-in, these flaws could result in early lifetime failures
for the memory device.
The industry demands high-quality DRAM memory modules. This is clearly
demonstrated by OEMs' stated objectives to reduce defective parts per
million (DPPM) rates to below 1000 DPPM/module in their high-end
applications such as servers and routers. Dynamic burn-in combined with its
proprietary ECM testing process gives SMART the ability to deliver memory
modules that conform to specified failure in time (FIT) rates.
To implement its new test procedure, SMART worked with Aehr Test Systems
(NASDAQ : AEHR ), a worldwide supplier of semiconductor test and burn-in
equipment, to design and develop the burn-in boards and test software.
SMART's new TDBI process uses Aehr Test's MTX-Fp+ system, which is a
massively parallel TDBI system featuring 128 data I/O channels, enhanced
pattern generation, and failure detection capability. As part of SMART's
comprehensive approach to test, each cell in every DRAM is exercised during
the 12-hour burn-in cycle at 125°C. Additional tests are performed after
burn-in as part of SMART's comprehensive ECM testing process.
"The MTX-Fp+ system adds a versatile tool to our ECM testing process,
supporting our continual drive to eliminate device failures for our
customers who require extremely high reliability levels," stated Larry
Alchesky, SMART's Senior Manager of Test Engineering.
Since each application stresses memory differently, SMART works closely
with its customers to correlate any latent defect or single bit error (SBE)
issues by customizing its testing procedures to simulate and exceed actual
system conditions. By combining dynamic burn-in and ECM testing, it is
SMART's ongoing goal to consistently deliver highly reliable memory
modules.
"We are very pleased that SMART has chosen our MTX-Fp+ for reliability
testing of their advanced DIMMs," said Bill Barraclough, Director of
Product Marketing at Aehr Test. "The MTX-Fp+ system lends itself well to
SMART's need for a high-quality, cost-effective method for collecting
reliability data, and we expect that SMART's leadership in this area will
lead other companies to validate their products' reliability using our MTX
systems."
For more information regarding SMART's extensive ECM test capabilities,
please visit www.smartm.com.
About SMART
SMART Modular Technologies is a leading provider of memory products,
offering more than 500 standard and custom products to top-tier OEMs in the
computer, industrial, networking, and telecommunications sectors. Taking
innovations from the design stage through manufacturing and delivery, SMART
has developed a comprehensive memory product line that includes DRAM, SRAM,
and Flash in various form factors. Through its subsidiary, Adtron
Corporation, SMART offers high performance, high capacity solid state flash
disk drives for enterprise, defense/aerospace, industrial automation,
medical, and transportation markets. SMART's Display Products Group
designs, manufactures and sells thin film transistors (TFT) liquid crystal
display (LCD) solutions to customers developing casino gaming systems as
well as embedded applications such as kiosk, ATM, point-of-service, and
industrial control systems. SMART's presence in the US, Europe, Asia, and
Latin America enables it to provide its customers with proven expertise in
international logistics, asset management, and supply-chain management
worldwide. More information on SMART can be obtained at
http://www.smartm.com.
About Aehr Test Systems
Headquartered in Fremont, California, Aehr Test Systems is a leading
worldwide provider of systems for burning-in and testing DRAMs, flash, and
other memory and logic integrated circuits and has an installed base of
more than 2,500 systems worldwide. Aehr Test has developed and introduced
several innovative products, including the FOXTM, MTX and MAX systems and
the DiePak® carrier. The FOX system is a full wafer contact test and
burn-in system. The MTX system is a massively parallel test system
designed to reduce the cost of memory testing by performing both test and
burn-in on thousands of devices simultaneously. The MAX system can
effectively burn-in and functionally test complex devices, such as digital
signal processors, microprocessors, microcontrollers and systems-on-a-chip.
The DiePak carrier is a reusable, temporary package that enables IC
manufacturers to perform cost-effective final test and burn-in of bare die.
For more information, please visit the Company's website at www.aehr.com.