KALISPELL, MT--(Marketwire - July 15, 2009) - Members of the international EMC3D
semiconductor equipment and materials consortium today announced they will
extend the life of the joint agreement to July 2011 from an original
closing date of October 2009.
The initial goals of the consortium were to bring to market individual unit
processes that can be quickly adopted into a volume production environment,
and establish a basic understanding of the interactive relationship between
process steps, all for a low overall Cost of Ownership (CoO) for 3D chip
stacking.
The consortium originally identified a CoO target of $200usd per wafer for
a fully processed die-to-wafer 3D stack on 300mm wafers. "Improvements of
equipment efficiency, simplified process flow and reduced material expenses
have been instrumental in lowering cost," said Paul Siblerud, EMC3D project
director. "Today, fabs running iTSV can produce 3D-TSV devices at a total
CoO of less than $150usd per wafer. Improved synchronization between the
unit processes along with aggressive cost saving designs have been very
successful at exceeding the consortium's original cost goals."
Sesh Ramaswami of Applied Materials said, "It has become clear that the
larger diameter via-last pTSV used in DRAM, interposers and CIS devices
have significantly different challenges than the smaller diameter high
aspect ratio via-first iTSV structures. From etch and metallization, film
stress management thru CMP and wafer bonding through debonding, these
challenges require an integrated approach that EMC3D will focus on during
this program extension."
"We are expanding our goal to include reliability improvements of both
via-first (iTSV™) and via-last (pTSV™) processes," said Bioh Kim of
EV Group. "Extending the roadmap to include a significantly reduced CoO to
under $120usd per wafer will be a challenge, but one each member looks
forward to working on."
About EMC3D
EMC3D (Semiconductor 3D Equipment and Materials Consortium) was created in
September 2006 to develop and market wafer level 3D chip stacking
technology by demonstrating a cost-effective, manufacturable, stackable TSV
interconnection process for IC and MEMS/Sensor packaging.
www.EMC3D.org or
http://twitter.com/EMC3DTSV
*3D: three dimensional; MEMS: microelectromechanical systems; iTSV is
interconnect Through-Silicon-Via; and pTSV is packaging Through-Silicon-Via
or Via-First and Via-Last respectively.
Contacts for EMC3D Members include:
Equipment Members:
Applied Materials Inc., California, USA, (NASDAQ: AMAT); Sesh Ramaswami,
Sr. Director, Strategy; Silicon Systems Group
Technology: etching, dielectric and metal deposition, chemical-mechanical
polishing, metrology, and inspection
Datacon Technology GmbH, Austria; Christoph Scheiring, Director,
Product Marketing
Technology: Precision Diebonding & Sorting
EV Group, Austria; Thorsten Matthias, Director of Technology, North America
Technology: bonding, thin wafer handling, mask alignment lithography,
conformal coat and develop
SEMITOOL Inc., USA, (NASDAQ: SMTL); Paul Siblerud, V.P. ElectroChemical
Deposition
Technology: electroplating, metal/barrier etch, photoresist strip, wafer
cleaning and thinning
Wafer Reclaim Services, USA; Fred Schiele, V.P. & General Manager
Technology: wafer service (reclaim and test wafers, wafer thinning, and
thick-film SOI wafers)
Materials Members:
AZ Electronic Materials, USA; Aldo Orsi, Global Product Manager
Technology: positive and negative acting photoresists
Enthone (Cookson Electronics), USA; Yun Zhang, Global Business Director
Technology: chemistry for plating, metal etch and pre-treatment
The Dow company, USA; Bob Forman, Advanced Packaging Business Manager
Technology: chemistry for lithography, plating, etching, dielectric
formation, and bonding
Brewer Science, Inc., USA; Mark Privett, Product Manager, Bonding Materials
Technology: Anti-reflective coatings, specialty materials for compound
semiconductor, optoelectronics, and MEMS applications. Spin coat, bake
and develop processing equipment, planarization systems
Technology Members:
CEA-LETI, Grenoble, France; Mark Scannell, Microelectronics Program Manager
Fraunhofer IZM, Germany; Jürgen Wolf, Group and Project Manager
NXP; Dr. Fred Roozeboom, Technical Advisor
KAIST (Korea Advanced Institute of Science and Technology), Korea;
Dr. Kyung-Wook Paik, Professor
SAIT (Samsung Advanced Institute of Technology), Korea; Dr. Yoon-Chul Sohn,
Researcher
TAMU (Texas A&M University), USA; Dr. Manuel Soriaga, Professor
Contact Information: Contacts:
EMC3D
Paul Siblerud
Program Director EMC3D
Vice President, Semitool
406.752.2107
Pfeiffer High Investor Relations, Inc.
Geoff High
303.393.7044