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FormFactor Ships 125th DRAM Wafer Probe Card With Advanced TRE(TM) Technology
Advanced TRE Extends the Life of Existing Testers and Reduces Additional Capital Expenditures
| Source: FormFactor
LIVERMORE, CA--(Marketwire - December 29, 2009) - FormFactor, Inc. (NASDAQ : FORM ) today
announced that it has reached a milestone with the shipment of the 125th
wafer probe card incorporating the company's proprietary advanced TRE™
technology. Advanced TRE technology enables FormFactor's probe cards to
make more efficient use of tester channels on test equipment to multiply
the number of devices that can be tested simultaneously on a wafer with
existing resources. As a result, probe cards incorporating FormFactor's
advanced TRE technology can extend the life of existing test equipment,
allowing semiconductor manufacturers to defer the cost of purchasing new
equipment while still addressing increases in test capacity or new test
requirements.
FormFactor has shipped probe cards with advanced TRE technology to several
of the top DRAM manufacturers, and are currently being used to test DDR2
and DDR3 DRAM devices with densities ranging from 512MB to 2GB. The
production-proven technology brings a new degree of intelligence to
FormFactor wafer probe cards through the integration of application
specific ICs. With this proprietary capability, FormFactor's advanced TRE
enabled probe cards take wafer test parallelism to the next level.
"As DRAM manufacturers drive to smaller technology nodes to lower their
production costs, the number of DRAM devices being produced and tested per
wafer continues to rise. As a result, our customers need innovative
solutions to lower their test costs while maintaining test quality," stated
Stefan Zschiegner, senior vice president and general manager of
FormFactor's DRAM Product Business Group. "By enabling higher levels of
test parallelism, FormFactor's wafer probe cards with advanced TRE
technology can lower the cost of test by up to 30 percent or more, as well
as help customers avoid millions of dollars in capital expenditure by
extending the life of their existing testers -- all without compromising on
test coverage and yield."
Forward-Looking Statements
Statements in this press release that are not strictly historical in nature
are forward-looking statements within the meaning of the federal securities
laws, including statements regarding future growth. These forward-looking
statements are based on current information and expectations that are
inherently subject to change and involve a number of risks and
uncertainties. Actual events or results might differ materially from those
in any forward-looking statement due to various factors, including, but not
limited to: the Company's ability to implement its advanced TRE technology
to enable its probe cards to multiply the number of devices that can be
tested simultaneously on a wafer with existing resources; whether the
Company's probe cards implementing advanced TRE technology allow
semiconductor manufacturers to defer the cost of purchasing new equipment
while still addressing increases in test capacity or new test requirements;
whether the Company's advanced TRE probe cards can lower the cost of test
by up to 30 percent or more without compromising on test coverage and
yield; and the Company's ability to implement its DC-Boost technology in
its advanced TRE probe cards to enable semiconductor manufacturers to
achieve increased test reading reliability and realize improved yields.
Additional information concerning factors that could cause actual events or
results to differ materially from those in any forward-looking statement is
contained in the company's Form 10-K for the fiscal year ended December 27,
2008 and the company's Form 10-Q for the fiscal quarter ended September 26,
2009, both as filed with the Securities and Exchange Commission ("SEC"),
and subsequent SEC filings. Copies of the company's SEC filings are
available at http://investors.formfactor.com/edgar.cfm. The company assumes
no obligation to update the information in this press release, to revise
any forward-looking statements or to update the reasons actual results
could differ materially from those anticipated in forward-looking
statements.
About FormFactor
Founded in 1993, FormFactor, Inc. (NASDAQ : FORM ) is the leader in advanced
wafer probe cards, which are used by semiconductor manufacturers to
electrically test ICs. The company's wafer sort, burn-in and device
performance testing products move IC testing upstream from post-packaging
to the wafer level, enabling semiconductor manufacturers to lower their
overall production costs, improve yields, and bring next-generation devices
to market. FormFactor is headquartered in Livermore, California with
operations in Europe, Asia and North America. For more information, visit
the company's web site at www.formfactor.com.
FormFactor and TRE are trademarks or registered trademarks of FormFactor,
Inc.