FREMONT, Calif., March 31, 2010 (GLOBE NEWSWIRE) -- Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received an order for its MAX-4i Burn-in and Test System from a leading Japanese semiconductor manufacturer. The system incorporates individual device temperature control and is configured for burning-in and testing microcomputers for high-end consumer products. The system is expected to ship during the second half of calendar year 2010.
"We are pleased to have received this order for a new member of the MAX family of systems," said Greg Perkins, vice president of worldwide sales and service at Aehr Test Systems. "Being able to economically perform burn-in and test with individual device temperature control for today's higher power devices is crucial for high-volume consumer products. We are optimistic that this could lead to our receipt of follow-on production orders for this version of the MAX system."
The MAX-4i system adds individual device under test (DUT) temperature control to the MAX family of burn-in and test systems. Individual DUT temperature control allows the system to control the temperature of each DUT very precisely, even though the DUTs in the system may have a wide range of power dissipations. The precise temperature control allows the user to ensure that the devices being burned in have the desired stress to eliminate latent defects before the devices are used in end products. The MAX family of systems has 96 input/output channels to allow complete exercise and test of most devices. For mixed signal devices, analog channels are also available. The systems can be connected to a factory network for full integration with the test process.
About Aehr Test Systems
Headquartered in Fremont, California, Aehr Test Systems is a worldwide supplier of systems for burning-in and testing memory and logic integrated circuits and has an installed base of more than 2,500 systems worldwide. Aehr Test has developed and introduced several innovative products, including the ABTSTM, FOXTM, MTX and MAX systems and the DiePak® carrier. The ABTS system is Aehr Test's newest system for packaged part test during burn-in for both low-power and high-power logic as well as all common types of memory devices. The FOX system is a full wafer contact test and burn-in system. The MTX system is a massively parallel test system designed to reduce the cost of memory testing by performing both test and burn-in on thousands of devices simultaneously. The MAX system can effectively burn-in and functionally test complex devices, such as digital signal processors, microprocessors, microcontrollers and systems-on-a-chip. The DiePak carrier is a reusable, temporary package that enables IC manufacturers to perform cost-effective final test and burn-in of bare die. For more information, please visit the Company's website at www.aehr.com.
Safe Harbor Statement
This release contains forward-looking statements that involve risks and uncertainties relating to projections regarding customer demand and acceptance of Aehr Test's products. Actual results may vary from projected results. These risks and uncertainties include, without limitation, acceptance by customers of the MAX technology, acceptance by customers of the MAX systems shipped upon receipt of a purchase order, the ability of new products to meet customer needs or perform as described and the receipt of follow-on orders for this version of the MAX. See Aehr Test's recent 10-K, 10-Q and other reports from time to time filed with the Securities and Exchange Commission (SEC) for a more detailed description of the risks facing our business. The Company disclaims any obligation to update information contained in any forward-looking statement to reflect events or circumstances occurring after the date of this press release.